Ion source for high-precision mass spectrometry

Patent · Sat Dec 31 23:00:00 EST 1983

OSTI ID:865095

Todd, Peter J ^[1]; McKown, Henry S ^[1]; Smith, David H ^[1]

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1. Oak Ridge, TN

The invention is directed to a method for increasing the precision of positive-ion relative abundance measurements conducted in a sector mass spectrometer having an ion source for directing a beam of positive ions onto a collimating slit. The method comprises incorporating in the source an electrostatic lens assembly for providing a positive-ion beam of circular cross section for collimation by the slit.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN
• DOE Contract Number: W-7405-ENG-26
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4459481
• OSTI ID: 865095
• Country of Publication: United States
• Language: English

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