Ion source for high-precision mass spectrometry

Patent · Mon Apr 26 00:00:00 EDT 1982

OSTI ID:6771402

Todd, P J; McKown, H S; Smith, D H

The invention is directed to a method for increasing the precision of positive-ion relative abundance measurements conducted in a sector mass spectrometer having an ion source for directing a beam of positive ions onto a collimating slit. The method comprises incorporating in the source an electrostatic lens assembly for providing a positive-ion beam of circular cross section for collimation by the slit. 2 figures, 3 tables.

• DOE Contract Number: W-7405-ENG-26
• Assignee: ERA-08-018327; EDB-83-050932
• Application Number: ON: DE83006898
• OSTI ID: 6771402
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
MASS SPECTROMETERS
ION SOURCES
MASS SPECTROSCOPY
OPTIMIZATION
PLUTONIUM
URANIUM
EXPERIMENTAL DATA
RELIABILITY
ACTINIDES
DATA
ELEMENTS
INFORMATION
MEASURING INSTRUMENTS
METALS
NUMERICAL DATA
SPECTROMETERS
SPECTROSCOPY
TRANSURANIUM ELEMENTS
400104* - Spectral Procedures- (-1987)