Ion source for high-precision mass spectrometry
Patent
·
OSTI ID:6771402
The invention is directed to a method for increasing the precision of positive-ion relative abundance measurements conducted in a sector mass spectrometer having an ion source for directing a beam of positive ions onto a collimating slit. The method comprises incorporating in the source an electrostatic lens assembly for providing a positive-ion beam of circular cross section for collimation by the slit. 2 figures, 3 tables.
- DOE Contract Number:
- W-7405-ENG-26
- Assignee:
- ERA-08-018327; EDB-83-050932
- Patent Number(s):
- None
- Application Number:
- ON: DE83006898
- OSTI ID:
- 6771402
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400104* -- Spectral Procedures-- (-1987)
ACTINIDES
DATA
ELEMENTS
EXPERIMENTAL DATA
INFORMATION
ION SOURCES
MASS SPECTROMETERS
MASS SPECTROSCOPY
MEASURING INSTRUMENTS
METALS
NUMERICAL DATA
OPTIMIZATION
PLUTONIUM
RELIABILITY
SPECTROMETERS
SPECTROSCOPY
TRANSURANIUM ELEMENTS
URANIUM
400104* -- Spectral Procedures-- (-1987)
ACTINIDES
DATA
ELEMENTS
EXPERIMENTAL DATA
INFORMATION
ION SOURCES
MASS SPECTROMETERS
MASS SPECTROSCOPY
MEASURING INSTRUMENTS
METALS
NUMERICAL DATA
OPTIMIZATION
PLUTONIUM
RELIABILITY
SPECTROMETERS
SPECTROSCOPY
TRANSURANIUM ELEMENTS
URANIUM