Ion source for high-precision mass spectrometry
Patent
·
OSTI ID:7256016
The invention is directed to a method for increasing the precision of positive-ion relative abundance measurements conducted in a sector mass spectrometer having an ion source for directing a beam of positive ions onto a collimating slit. The method comprises incorporating in the source an electrostatic lens assembly for providing a positive-ion beam of circular cross section for collimation by the slit. 3 figs.
- Assignee:
- Dept. of Energy, Washington, DC (United States)
- Patent Number(s):
- A; US 4459481
- Application Number:
- PPN: US 6-371744
- OSTI ID:
- 7256016
- Country of Publication:
- United States
- Language:
- English
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