Method for detecting trace impurities in gases

Patent · Wed Dec 31 23:00:00 EST 1980

OSTI ID:863871

Freund, Samuel M ^[1]; Holland, Redus F ^[2]; Beattie, Willard H ^[2]

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1. Santa Fe, NM
2. Los Alamos, NM

A technique for considerably improving the sensitivity and specificity of infrared spectrometry as applied to quantitative determination of trace impurities in various carrier or solvent gases is presented. A gas to be examined for impurities is liquefied and infrared absorption spectra of the liquid are obtained. Spectral simplification and number densities of impurities in the optical path are substantially higher than are obtainable in similar gas-phase analyses. Carbon dioxide impurity (.about.2 ppm) present in commercial Xe and ppm levels of Freon 12 and vinyl chloride added to liquefied air are used to illustrate the method.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4264814
• OSTI ID: 863871
• Country of Publication: United States
• Language: English

Related Subjects

/250/
12
absorption
absorption spectra
added
air
analyses
applied
carbon
carbon dioxide
carrier
chloride
commercial
considerably
densities
detecting
detecting trace
determination
dioxide
examined
freon
gas
gas-phase
gases
illustrate
improving
impurities
impurity
infrared
infrared spectrometry
levels
liquefied
liquid
method
obtainable
obtained
optical
optical path
path
ppm
quantitative
quantitative determination
sensitivity
similar
simplification
solvent
specificity
spectra
spectral
spectrometry
substantially
technique
trace
trace impurities
various
vinyl
vinyl chloride
xe