Method for detecting trace impurities in gases

Patent · Tue Apr 28 00:00:00 EDT 1981

OSTI ID:5889101

Beattie, W H; Freund, S M; Holland, R F; Maier, W B

A technique for considerably improving the sensitivity and specificity of infrared spectrometry as applied to quantitative determination of trace impurities in various carrier or solvent gases is presented. A gas to be examined for impurities is liquefied and infrared absorption spectra of the liquid are obtained. Spectral simplification and number densities of impurities in the optical path are substantially higher than are obtainable in similar gas-phase analyses. Carbon dioxide impurity (*2 ppm) present in commercial xe and ppm levels of freon 12 and vinyl chloride added to liquefied air are used to illustrate the method.

• Assignee: Department of Energy
• Patent Number(s): US 4264814
• OSTI ID: 5889101
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400104* -- Spectral Procedures-- (-1987)
CHEMICAL ANALYSIS
CRYOGENICS
GAS ANALYSIS
INFRARED SPECTROMETERS
LIQUEFACTION
MEASURING INSTRUMENTS
MICROANALYSIS
QUALITATIVE CHEMICAL ANALYSIS
QUANTITATIVE CHEMICAL ANALYSIS
SENSITIVITY
SPECTROMETERS
THERMOCHEMICAL PROCESSES
TRACE AMOUNTS