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Title: Method for detecting trace impurities in gases

Patent ·
OSTI ID:5406598

A technique for considerably improving the sensitivity and specificity of infrared spectrometry as applied to quantitative determination of trace impurities in various carrier or solvent gases is presented. A gas to be examined for impurities is liquefied and infrared absorption spectra of the liquid are obtained. Spectral simplification and number densities of impurities in the optical path are substantially higher than are obtainable in similar gas-phase analyses. Carbon dioxide impurity (approx. 2 ppM) present in commercial Xe and ppM levels of Freon 12 and vinyl chloride added to liquefied air are used to illustrate the method.

DOE Contract Number:
W-7405-ENG-36
Assignee:
TIC; ERA-05-029376; EDB-80-084706
OSTI ID:
5406598
Country of Publication:
United States
Language:
English