Method for detecting trace impurities in gases

Patent ·

OSTI ID:5406598

Freund, S M; Maier, II, W B; Holland, R F; Beattie, W H

A technique for considerably improving the sensitivity and specificity of infrared spectrometry as applied to quantitative determination of trace impurities in various carrier or solvent gases is presented. A gas to be examined for impurities is liquefied and infrared absorption spectra of the liquid are obtained. Spectral simplification and number densities of impurities in the optical path are substantially higher than are obtainable in similar gas-phase analyses. Carbon dioxide impurity (approx. 2 ppM) present in commercial Xe and ppM levels of Freon 12 and vinyl chloride added to liquefied air are used to illustrate the method.

• DOE Contract Number: W-7405-ENG-36
• Assignee: TIC; EDB-80-084706; ERA-05-029376
• Patent Number(s): None
• OSTI ID: 5406598
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400104* -- Spectral Procedures-- (-1987)
ABSORPTION SPECTROSCOPY
CARBON COMPOUNDS
CARBON DIOXIDE
CARBON OXIDES
CHALCOGENIDES
CHEMICAL ANALYSIS
CHLORINATED ALIPHATIC HYDROCARBONS
ELEMENTS
FLUIDS
FREONS
GASES
HALOGENATED ALIPHATIC HYDROCARBONS
IMPURITIES
INFRARED SPECTRA
MONOMERS
NONMETALS
ORGANIC CHLORINE COMPOUNDS
ORGANIC COMPOUNDS
ORGANIC HALOGEN COMPOUNDS
OXIDES
OXYGEN COMPOUNDS
RARE GASES
REFRIGERANTS
SENSITIVITY
SPECTRA
SPECTROSCOPY
VINYL MONOMERS
WORKING FLUIDS
XENON