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Noise reduction efforts for the ALS infrared beamlines

Journal Article · · Infrared Physics and Technology
OSTI ID:837806
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  1. LBNL Library
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The quality of infrared microscopy and spectroscopy data collected at synchrotron based sources is strongly dependent on signal-to-noise. We have successfully identified and suppressed several noise sources affecting Beamlines 1.4.2, 1.4.3, and 1.4.4 at the Advanced Light Source (ALS), resulting in a significant increase in the quality of FTIR spectra obtained. In this paper, we present our methods of noise source analysis, the negative effect of noise on the infrared beam quality, and the techniques used to reduce the noise. These include reducing the phase noise in the storage ring radio-frequency (RF) system, installing an active mirror feedback system, analyzing and changing physical mounts to better isolate portions of the beamline optics from low-frequency environmental noise, and modifying the input signals to the main ALS RF system. We also discuss the relationship between electron beam energy oscillations at a point of dispersion and infrared beamline noise.
Research Organization:
Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
Sponsoring Organization:
USDOE Director. Office of Science. Office of Basic Energy Sciences. Materials Science and Engineering Division (US)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
837806
Report Number(s):
LBNL--53724
Journal Information:
Infrared Physics and Technology, Journal Name: Infrared Physics and Technology Journal Issue: 5-6 Vol. 45
Country of Publication:
United States
Language:
English

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Related Subjects

43 PARTICLE ACCELERATORS
ADVANCED LIGHT SOURCE
ELECTRON BEAMS
FEEDBACK
INFRARED BEAMLINE NOISE INFRARED SIGNAL-TO-NOISE RF PHASE NOISE VIBRATION
MICROSCOPY
MIRRORS
OPTICS
OSCILLATIONS
RF SYSTEMS
SPECTRA
SPECTROSCOPY
STORAGE RINGS
SYNCHROTRONS