Noise Reduction Efforts for the ALS Infrared Beamlines

Journal Article · Wed May 12 04:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1757853· OSTI ID:20653003

Scarvie, Tom; Andresen, Nord; Baptiste, Ken; Byrd, John; Chin, Mike; Martin, Michael; McKinney, Wayne; Steier, Christoph ^[1]

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1. Advanced Light Source Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd, Berkeley, CA 94720 (United States)

The quality of infrared microscopy and spectroscopy data collected at synchrotron based sources is strongly dependent on signal-to-noise. We have successfully identified and suppressed several noise sources affecting Beamlines 1.4.2, 1.4.3, and 1.4.4 at the Advanced Light Source (ALS), resulting in a significant increase in the quality of FTIR spectra obtained. In this paper, we present our methods of noise source analysis, the negative effect of noise on the infrared beam quality, and the techniques used to reduce the noise. These include reducing the phase noise in the storage ring radio-frequency (RF) system, installing an active mirror feedback system, analyzing and changing physical mounts to better isolate portions of the beamline optics from low-frequency environmental noise, and modifying the input signals to the main ALS RF system. We also discuss the relationship between electron beam energy oscillations at a point of dispersion and infrared beamline noise.

• OSTI ID: 20653003
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 705; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ADVANCED LIGHT SOURCE
BEAM OPTICS
ELECTRON BEAMS
FEEDBACK
FOURIER TRANSFORMATION
INFRARED SPECTRA
MICROSCOPY
MIRRORS
NOISE
OSCILLATIONS
RADIOWAVE RADIATION
RF SYSTEMS
SIGNALS
SPECTROSCOPY
SYNCHROTRON RADIATION
SYNCHROTRONS