MOCVD of yttria stabilized zirconia on Co-Cr

Conference · Tue Aug 01 04:00:00 EDT 1995

OSTI ID:82554

Greenwald, A C; Loges, P G ^[1]; Kaloyeros, A E ^[2]

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1. Spire Corp., Bedford, MA (United States)
2. State Univ. of New York, Albany, NY (United States). Dept. of Physics

Thin films of yttria stabilized zirconia (YSZ) were deposited by metal organic chemical vapor deposition (MOCVD) on cobalt-chromium (Co-Cr) alloys used for orthopedic implants. TMHD derivatives were preferred for the metalorganic sources over the less expensive fluorinated beta-diketonates as the latter left up to 1% fluorine in the film, as determined by Auger spectroscopy. Crystalline cubic structure of these YSZ films was verified by X-ray diffraction. Columnar grain growth gave a rough surface on thicker YSZ films, which increased wear of the mating polyethylene component during simulation tests. YSZ films under one micron thick were mirror smooth and reduced wear of the polymer component by 70% compared to uncoated Co-Cr. Film adhesion was excellent.

• OSTI ID: 82554
• Report Number(s): CONF-941144--; ISBN 1-55899-264-2
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ADHESION
BONE JOINTS
CHEMICAL VAPOR DEPOSITION
CHROMIUM ALLOYS
COBALT ALLOYS
CRYSTAL STRUCTURE
MICROHARDNESS
MORPHOLOGY
ORGANOMETALLIC COMPOUNDS
POLYETHYLENES
WEAR
X-RAY DIFFRACTION
YTTRIUM OXIDES
ZIRCONIUM OXIDES