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Photoelectron diffraction imaging for C{sub 2}H{sub 2} and C{sub 2}H{sub 4} chemisorbed on Si(100) reveals a new bonding configuration

Journal Article · · Physical Review Letters
OSTI ID:771871
A new adsorption site for adsorbed acetylene on Si(100) is observed by photoelectron imaging based on the holographic principle. The diffraction effects in the carbon 1s angle-resolved photoemission are inverted (including the small-cone method) to obtain an image of the atom's neighboring carbon. The chemisorbed acetylene molecule is bonded to four silicon surface atoms. In contrast to the C{sub 2}H{sub 2} case, the image for adsorbed C{sub 2}H{sub 4} shows it bonded to two Si surface atoms.
Research Organization:
Lawrence Berkeley National Lab., CA (US)
Sponsoring Organization:
USDOE Director, Office of Science. Office of Basic Energy Studies. Division of Materials Sciences (US)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
771871
Report Number(s):
LBNL--46090
Journal Information:
Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 5 Vol. 84; ISSN 0031-9007; ISSN PRLTAO
Country of Publication:
United States
Language:
English