Photoelectron Diffraction Imaging for C{sub 2}H{sub 2} and C{sub 2}H{sub 4} Chemisorbed on Si(100) Reveals a New Bonding Configuration

Journal Article · Mon Jan 31 04:00:00 EST 2000 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.84.939· OSTI ID:20215360

Xu, S H ^[1]; Keeffe, M ^[1]; Yang, Y ^[1]; Chen, C ^[1]; Yu, M ^[1]; Lapeyre, G J ^[1]; Rotenberg, E ^[2]; Denlinger, J ^[2]; Yates, Jr, J T ^[3]

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1. Department of Physics, Montana State University, Bozeman, Montana 59717-3840 (United States)
2. Advanced Light Source, LBNL, Berkeley, California 94720 (United States)
3. Surface Science Center, Departments of Chemistry and Physics, University of Pittsburgh, Pittsburgh, Pennsylvania 15260 (United States)

A new adsorption site for adsorbed acetylene on Si(100) is observed by photoelectron imaging based on the holographic principle. The diffraction effects in the carbon 1s angle-resolved photoemission are inverted (including the small-cone method) to obtain an image of the atom's neighboring carbon. The chemisorbed acetylene molecule is bonded to four silicon surface atoms. In contrast to the C{sub 2}H {sub 2} case, the image for adsorbed C{sub 2}H {sub 4} shows it bonded to two Si surface atoms. (c) 2000 The American Physical Society.

• OSTI ID: 20215360
• Journal Information: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 5 Vol. 84; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
ACETYLENE
BONDING
CHEMISORPTION
ELECTRON DIFFRACTION
ETHYLENE
EXPERIMENTAL DATA
HOLOGRAPHY
PHOTOELECTRON SPECTROSCOPY
SILICON