Beam test results for the BTeV silicon pixel detector
Conference
·
OSTI ID:764083
- Fermilab
The authors report the results of the BTeV silicon pixel detector tests carried out in the MTest beam at Fermilab in 1999--2000. The pixel detector spatial resolution has been studied as a function of track inclination, sensor bias, and readout threshold.
- Research Organization:
- Fermi National Accelerator Lab., Batavia, IL (US)
- Sponsoring Organization:
- USDOE Office of Energy Research (ER) (US)
- DOE Contract Number:
- AC02-76CH03000
- OSTI ID:
- 764083
- Report Number(s):
- FERMILAB-Conf-00/227-E
- Country of Publication:
- United States
- Language:
- English
Similar Records
Beam test results of the BTeV silicon pixel detector
First look at the beam test results of the FPIX2 readout chip for the BTeV silicon pixel detector
Study of indium and solder bumps for the BTeV Pixel Detector
Conference
·
Thu Sep 28 00:00:00 EDT 2000
·
OSTI ID:764081
First look at the beam test results of the FPIX2 readout chip for the BTeV silicon pixel detector
Journal Article
·
Sun Oct 31 23:00:00 EST 2004
·
OSTI ID:15017019
Study of indium and solder bumps for the BTeV Pixel Detector
Conference
·
Tue Nov 04 23:00:00 EST 2003
·
OSTI ID:816988