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Thermal-Stress Effects and Enhanced Low Dose Rate Sensitivity in Linear Bipolar Ics

Journal Article · Tue Aug 01 00:00:00 EDT 2000 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.903805· OSTI ID:760012

SHANEYFELT, MARTY R ^[1]; SCHWANK, JAMES R; WITCZAK, STEVEN C; FLEETWOOD, D M; PEASE, R L; WINOKUR, PETER S; RIEWE, LEONARD CHARLES; HASH, GERALD L

Sandia National Laboratories

No abstract prepared.

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Research Organization:: Sandia National Labs., Albuquerque, NM (US); Sandia National Labs., Livermore, CA (US)

Sponsoring Organization:: US Department of Energy (US)

DOE Contract Number:: AC04-94AL85000

OSTI ID:: 760012

Report Number(s):: SAND2000-2001J

Journal Information:: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science

Country of Publication:: United States

Language:: English

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Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DOSE RATES
INTEGRATED CIRCUITS
RADIATION EFFECTS
SENSITIVITY
THERMAL STRESSES