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Developing passivation layers for reducing enhanced low-dose-rate sensitivity in linear bipolar devices.

Conference ·
OSTI ID:915201
; ;  [1]; ;  [2]; ;  [3]
  1. RLP Research, Albuquerque, NM
  2. National Semiconductor Corporation, Portland, ME
  3. National Semiconductor Corporation, Portland, ME
+ Show Author Affiliations

No abstract prepared.

Research Organization:
Sandia National Laboratories
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
OSTI ID:
915201
Report Number(s):
SAND2003-0561C
Country of Publication:
United States
Language:
English

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Related Subjects

36 MATERIALS SCIENCE
PASSIVATION
RADIATION EFFECTS
SENSITIVITY