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Field Emission and Nanostructure of Carbon Films

Conference ·
OSTI ID:755658

The results of field emission measurements of various forms of carbon films are reported. It is shown that the films nanostructure is a crucial factor determining the field emission properties. In particular, smooth, pulsed-laser deposited amorphous carbon films with both high and low sp3 contents are poor field emitters. This is similar to the results obtained for smooth nanocrystalline, sp2-bonded carbon films. In contrast, carbon films prepared by hot-filament chemical vapor deposition (HE-CVD) exhibit very good field emission properties, including low emission turn-on fields, high emission site density, and excellent durability. HF-CVD carbon films were found to be predominantly sp2-bonded. However, surface morphology studies show that these films are thoroughly nanostructured, which is believed to be responsible for their promising field emission properties.

Research Organization:
Oak Ridge National Lab., TN (US)
Sponsoring Organization:
USDOE Office of Science (US)
DOE Contract Number:
AC05-00OR22725
OSTI ID:
755658
Report Number(s):
ORNL/CP-105622
Country of Publication:
United States
Language:
English

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