Observation of the Josephson effect in Nb/sub 3/Ge Dayem bridges

Conference · Sat Mar 01 00:00:00 EDT 1975 · IEEE Trans. Magn.; (United States)

OSTI ID:7367610

Janocko, M A; Gavaler, J R; Jones, C K

Dayem bridge Josephson junctions were successfully fabricated for the first time from sputtered thin films of high-T/sub c/ Nb/sub 3/Ge. Microwave induced current steps were observed in the I-V characteristic of one of these junctions at a frequency of 10 GHz at temperatures between 20.9 and 21.0/sup 0/K. This junction was fabricated by a mechanical scribing technique, instead of sputter etching. Sputter etched junctions also exhibited Josephson steps, but only at much lower temperatures, due to a depression of T/sub c/ by the sputter etching process. (auth)

• Research Organization: Westinghouse Research Labs., Pittsburgh
• NSA Number: NSA-33-17129
• OSTI ID: 7367610
• Journal Information: IEEE Trans. Magn.; (United States), Journal Name: IEEE Trans. Magn.; (United States) Vol. MAG-11:2; ISSN IEMGA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360100 -- Metals & Alloys
420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ALLOYS
ELECTRIC BRIDGES
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
ELECTROMAGNETIC RADIATION
EQUIPMENT
ETCHING
FABRICATION
GERMANIUM ALLOYS
INTERMETALLIC COMPOUNDS
JOSEPHSON EFFECT
JOSEPHSON JUNCTIONS
MICROWAVE RADIATION
NIOBIUM ALLOYS
NIOBIUM BASE ALLOYS
PERFORMANCE TESTING
PHYSICAL PROPERTIES
RADIATIONS
SPUTTERING
SUPERCONDUCTING JUNCTIONS
SURFACE FINISHING
TESTING