Observation of the Josephson effect in Nb$sub 3$Ge Dayem bridges
Conference
·
· IEEE Trans. Magn., v. MAG-11, no. 2, pp. 880-882
OSTI ID:4094443
Dayem bridge Josephson junctions were successfully fabricated for the first time from sputtered thin films of high-T/sub c/ Nb$sub 3$Ge. Microwave induced current steps were observed in the I-V characteristic of one of these junctions at a frequency of 10 GHz at temperatures between 20.9 and 21.0$sup 0$K. This junction was fabricated by a mechanical scribing technique, instead of sputter etching. Sputter etched junctions also exhibited Josephson steps, but only at much lower temperatures, due to a depression of T/sub c/ by the sputter etching process. (auth)
- Research Organization:
- Westinghouse Research Labs., Pittsburgh
- NSA Number:
- NSA-33-017129
- OSTI ID:
- 4094443
- Journal Information:
- IEEE Trans. Magn., v. MAG-11, no. 2, pp. 880-882, Journal Name: IEEE Trans. Magn., v. MAG-11, no. 2, pp. 880-882; ISSN IEMGA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
*ELECTRIC BRIDGES-- JOSEPHSON EFFECT
*JOSEPHSON JUNCTIONS-- PERFORMANCE TESTING
420201* --Engineering--Facilities & Equipment--Cryogenic & Superconducting Equipment & Devices
ELECTRICAL PROPERTIES
ETCHING
GERMANIUM ALLOYS
INTERMETALLIC COMPOUNDS
MICROWAVE RADIATION
N42220* --Engineering--Facilities & Equipment--Cryogenic & Superconducting Equipment & Devices
NIOBIUM BASE ALLOYS
SPUTTERING
*JOSEPHSON JUNCTIONS-- PERFORMANCE TESTING
420201* --Engineering--Facilities & Equipment--Cryogenic & Superconducting Equipment & Devices
ELECTRICAL PROPERTIES
ETCHING
GERMANIUM ALLOYS
INTERMETALLIC COMPOUNDS
MICROWAVE RADIATION
N42220* --Engineering--Facilities & Equipment--Cryogenic & Superconducting Equipment & Devices
NIOBIUM BASE ALLOYS
SPUTTERING