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Observation of the Josephson effect in Nb$sub 3$Ge Dayem bridges

Conference · · IEEE Trans. Magn., v. MAG-11, no. 2, pp. 880-882
OSTI ID:4094443

Dayem bridge Josephson junctions were successfully fabricated for the first time from sputtered thin films of high-T/sub c/ Nb$sub 3$Ge. Microwave induced current steps were observed in the I-V characteristic of one of these junctions at a frequency of 10 GHz at temperatures between 20.9 and 21.0$sup 0$K. This junction was fabricated by a mechanical scribing technique, instead of sputter etching. Sputter etched junctions also exhibited Josephson steps, but only at much lower temperatures, due to a depression of T/sub c/ by the sputter etching process. (auth)

Research Organization:
Westinghouse Research Labs., Pittsburgh
NSA Number:
NSA-33-017129
OSTI ID:
4094443
Journal Information:
IEEE Trans. Magn., v. MAG-11, no. 2, pp. 880-882, Journal Name: IEEE Trans. Magn., v. MAG-11, no. 2, pp. 880-882; ISSN IEMGA
Country of Publication:
United States
Language:
English