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Observation of the Josephson effect in Nb/sub 3/Ge Dayem bridges. Technical report

Technical Report ·
OSTI ID:7365372

Dayem bridge Josephson junctions were successfully fabricated for the first time from sputtered thin films of high-T/sub c/ Nb/sub 3/Ge. Microwave induced current steps were observed in the I--V characteristic of one of these junctions at a frequency of 10 GHz at temperatures between 20.9 and 21.0/sup 0/K. This junction was fabricated by a mechanical scribing technique instead of sputter etching. Sputter etched junctions also exhibited Josephson steps, but only at much lower temperatures, due to a depression of T/sub c/ by the sputter etching process.

Research Organization:
Westinghouse Research Labs., Pittsburgh, Pa. (USA)
OSTI ID:
7365372
Report Number(s):
AD/A-007571
Country of Publication:
United States
Language:
English

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