Radiation thickness gauge. [for process control in metals rolling mills]

Patent · Tue May 04 04:00:00 EDT 1976

OSTI ID:7361470

Tsujii, T; Nishiwaki, F

In a radiation thickness gauge of the type wherein the thickness of a sample is determined by measuring the amount of radiations transmitting through the sample, there is provided an x-ray generator for transmitting a radiation flux through a reference sheet utilized for calibration purposes and having a thickness manifesting a radiation absorption which is equivalent to that of the sample having a nominal thickness which has been compensated for the difference in the radiation absorption characteristics of the reference sheet and the sample, a radiation detector for detecting the amount of the radiations transmitting through the reference sheet and the sample, a memory for storing the output of the detector when the reference sheet is interposed, and an operator, such as a computer. The operator functions to substitute the output of the radiation detector when the sample is interposed for a term representing the variation in the thickness of an equation determined by the content of the memory and the radiation absorption function of the reference sheet so as to produce an output signal representing the thickness of the sample.

• Assignee: Tokyo Shibaura Denki Kabushiki Kaisha
• Patent Number(s): US 3955086
• OSTI ID: 7361470
• Country of Publication: United States
• Language: English

Related Subjects

440105* -- Radiation Instrumentation-- Radiometric Instruments-- (-1987)
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALLOYS
ALUMINIUM
COMPUTERS
CONTROL
CONTROL SYSTEMS
DATA ACQUISITION SYSTEMS
DESIGN
DIMENSIONS
ELECTROMAGNETIC RADIATION
ELEMENTS
FABRICATION
IONIZING RADIATIONS
IRON ALLOYS
IRON BASE ALLOYS
MATERIALS WORKING
MEASURING INSTRUMENTS
METALS
PROCESS CONTROL
RADIATIONS
RADIOMETRIC GAGES
ROLLING
STEELS
THICKNESS
THICKNESS GAGES
X RADIATION