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Dual beam x-ray thickness gauge

Patent ·
OSTI ID:7294864
The apparatus and method for continuous measurement of thickness of a sheet at a rolling mill or the like without contacting the sheet are described. A system directing radiation through the sheet in two energy bands and providing a measure of change in composition of the material as it passes the thickness gauging station is included. A system providing for changing the absorption coefficient of the material in the thickness measurement as a function of the change in composition so that the measured thickness is substantially independent of variations in composition is described.
Assignee:
Nucleonic Data Systems, Inc.
Patent Number(s):
US 4037104
OSTI ID:
7294864
Country of Publication:
United States
Language:
English

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Related Subjects

440105* -- Radiation Instrumentation-- Radiometric Instruments-- (-1987)
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHEMICAL COMPOSITION
CORRECTIONS
DESIGN
DIMENSIONS
ELECTRONIC CIRCUITS
FABRICATION
MATERIALS WORKING
MEASURING INSTRUMENTS
RADIOMETRIC GAGES
ROLLING
SHEETS
THICKNESS
THICKNESS GAGES