Self-compensating x-ray or. gamma. -ray thickness gauge
Patent
·
OSTI ID:5043460
A gauge is described for determining the mass per unit area, or alternatively the thickness of sheet material by measuring the attenuation, as well as backscatter, of an x-ray beam or the like, while continuously taking into account deviations and changes in localized material composition, insofar as these have an effect on the transmission coefficient of the beam. Electrical signals representing these deviations are combined with calibration data for given material nominal properties, i.e., nominal composition. The resultant and output signal represents the mass per unit area or thickness.
- Assignee:
- TIC; EDB-78-075600; ERA-03-037924
- Patent Number(s):
- US 4047029
- OSTI ID:
- 5043460
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440105* -- Radiation Instrumentation-- Radiometric Instruments-- (-1987)
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DESIGN
DIMENSIONS
ELECTROMAGNETIC RADIATION
GAMMA RADIATION
IONIZING RADIATIONS
MEASURING INSTRUMENTS
OPERATION
RADIATIONS
RADIOMETRIC GAGES
SHEETS
THICKNESS
THICKNESS GAGES
X RADIATION
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DESIGN
DIMENSIONS
ELECTROMAGNETIC RADIATION
GAMMA RADIATION
IONIZING RADIATIONS
MEASURING INSTRUMENTS
OPERATION
RADIATIONS
RADIOMETRIC GAGES
SHEETS
THICKNESS
THICKNESS GAGES
X RADIATION