Effects of shadows on photocurrent-compensated integrated circuits. Interim report
Technical Report
·
OSTI ID:7355145
Simple calculations show that high-z components, such as wires, capacitors, and solder bonds, can easily cast shadows with edges only 25-micrometers wide when illuminated with a low-energy (E less than 60 keV) x-ray beam. If one of these shadows falls between a photocurrent-compensating diode-transistor pair, the mismatch in dose can drastically reduce the transient hardness of the integrated circuit. Results of pulsed x-ray tests on the Texas Instruments RSN 54L 71 R--S flip-flop and RSN 54L 00 quad two-input nand gate showed that the upset threshold of a given state of the flip-flop was lowered by as much as a factor of 29 and the nand gate by a factor of 5.7.
- Research Organization:
- Aerospace Corp., El Segundo, Calif. (USA). Materials Sciences Lab.
- OSTI ID:
- 7355145
- Report Number(s):
- AD/A-009841
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CURRENTS
ELECTRIC CURRENTS
ELECTROMAGNETIC RADIATION
ELECTRONIC CIRCUITS
FLIP-FLOP CIRCUITS
HARDENING
INTEGRATED CIRCUITS
IONIZING RADIATIONS
MICROELECTRONIC CIRCUITS
MULTIVIBRATORS
PHYSICAL RADIATION EFFECTS
PULSE CIRCUITS
RADIATION EFFECTS
RADIATION HARDENING
RADIATIONS
TRANSIENTS
X RADIATION
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CURRENTS
ELECTRIC CURRENTS
ELECTROMAGNETIC RADIATION
ELECTRONIC CIRCUITS
FLIP-FLOP CIRCUITS
HARDENING
INTEGRATED CIRCUITS
IONIZING RADIATIONS
MICROELECTRONIC CIRCUITS
MULTIVIBRATORS
PHYSICAL RADIATION EFFECTS
PULSE CIRCUITS
RADIATION EFFECTS
RADIATION HARDENING
RADIATIONS
TRANSIENTS
X RADIATION