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U.S. Department of Energy
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NRL Van de Graaff operation, 1 January--31 December 1974. Interim report

Technical Report ·
OSTI ID:7349499
In the Cooperative Radiation Effects Simulation Program, a number of nickel alloys (primarily Ni-Al, but there were three dilute-solution alloys containing separately 1 at.% of V, Ti, or Cu) were irradiated with 2.8-MeV /sup 58/Ni(+)ions at dose rates from .0007 to .07 dpa/s with the targets at temperatures from 525 to 725/sup 0/C. In the ion-solid interactions program, projectile ions of S, Ar, Ca, Ni, and Kr from 2.0 to 7.8 MeV have been used to bombard targets of Al, and the resulting Al K alpha spectra have been measured; and 4-MeV S ions have been used to bombard targets of Al, Si, GaP, KCl, Ca, and Ti, and the resulting S K alpha spectra have been measured. In another part of this program, ion-excited XUV radiation has been measured when various ions from Al to Ar collide with various target atoms from Be to Ni. Ion-implantation has been studied as an alternate means of doping SiC with Al, and the role of oxygen in the luminescence of SiC crystals has been studied by the implantation of 16O(+) ions to fluences from 10 to the 12th power atoms/sq cm to 10 to the 16th power atoms/sq cm. The use of the charged particle magnetic spectrometer has been studied as a tool in the application of Rutherford backscattering of ions in materials analysis. And the nuclear-resonance technique has been developed as a means of measuring the depth concentration profiles of Al and Na in metal-oxide-semiconductor devices. (GRA)
Research Organization:
Naval Research Lab., Washington, DC (USA)
OSTI ID:
7349499
Report Number(s):
AD-A-014507; NRL-MR-3078
Country of Publication:
United States
Language:
English