Electrical properties of DuPont Birox and Cermalloy thick film resistors II: conduction mechanisms
An experimental study of the electrical conduction mechanisms in thick film resistors is presented. The resistors were made from one custom and three commercially formulated inks with resistivity compositions ranging from 10/sup 2/ to 10/sup 6/ OMEGA/square in decade increments. Their microstructure and composition have been examined using optical and scanning electron microscopy, electron microprobe analysis, x-ray diffraction, and various chemical analyses. This portion of the study shows that the resistors are heterogeneous mixtures of metal oxide particles (approximately 4 x 10/sup -5/ cm dia) and a lead silicate glass. The metal oxide particles are ruthenium containing pyrochlores, and are joined to form a continuous three dimensional network of chain segments. The principal experimental work reported is an extensive study of the electrical transport properties of the resistors.
- Research Organization:
- Sandia Labs., Albuquerque, NM (USA)
- DOE Contract Number:
- EY-76-C-04-0789
- OSTI ID:
- 7316635
- Report Number(s):
- SAND-76-0558
- Country of Publication:
- United States
- Language:
- English
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