Microstructural studies of thick film resistors using transmission electron microscopy
The microstructure of thick film resistors of the duPont 1400 series fired on 96% Al/sub 2/O/sub 3/ at 850/sup 0/C was characterized using transmission electron microscopy. Samples were prepared by a combination of precision grinding and ion milling. Each sample was examined for crystallinity, phase morphology, particle size, elemental composition and phase identification. X-ray energy dispersive spectroscopy was used for elemental composition determination and electron diffraction for phase identification. Microstructure of the 1421 (10/sup 2/ ..cap omega../square) material is composed mainly of crystallites (< 100 nm) of lead bismuth ruthenate in a lead bismuth silicate glass. The 1461 (10/sup 6/..cap omega..1/square) material is composed of lead ruthenate crystals in a lead silicate glass along with quartz crystals. For both resistors most crystallites are surrounded by the glassy phase.
- Research Organization:
- Sandia Labs., Albuquerque, NM (USA)
- DOE Contract Number:
- EY-76-C-04-0789
- OSTI ID:
- 5713251
- Report Number(s):
- SAND-79-0387C; CONF-791113-4
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
360601* -- Other Materials-- Preparation & Manufacture
360602 -- Other Materials-- Structure & Phase Studies
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
BISMUTH COMPOUNDS
BISMUTH OXIDES
CHALCOGENIDES
CHEMICAL COMPOSITION
COMMINUTION
CRYSTAL STRUCTURE
DIMENSIONS
ELECTRICAL EQUIPMENT
ELECTRON MICROSCOPY
EQUIPMENT
FABRICATION
GLASS
GRINDING
LEAD COMPOUNDS
LEAD OXIDES
LEAD SILICATES
MACHINING
MICROSCOPY
MICROSTRUCTURE
MORPHOLOGY
OXIDES
OXYGEN COMPOUNDS
PHASE STUDIES
RESISTORS
RUTHENIUM COMPOUNDS
RUTHENIUM OXIDES
SILICATES
SILICON COMPOUNDS
SUBSTRATES
THICKNESS
TRANSITION ELEMENT COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY