Phase composition and electrophysical properties of ruthenium resistors modified by oxide compounds of niobium (V)

Journal Article · Mon Sep 01 00:00:00 EDT 1986 · Inorg. Mater. (Engl. Transl.); (United States)

OSTI ID:6963252

Lozinskii, N S; Gruba, A I; Shevtsova, N A; Troyanova, T A; Volkov, V I

The authors study some electrophysical properties, as well as the phase composition, of real ruthenium thick-film resistors based on lead ruthenate(IV) with additions of niobium(V) compounds by the x-ray powder diffraction method. The study revealed that regardless of the composition of the niobium-containing additions in the modified ruthenium resistor, lead ruthenate(IV), ruthenium dioxide, and Pb1.5Nb/sub 2/O /SUB 6.5/ are present in the form of crystalline phases. The electrophysical properties of resistors modified by oxide compounds of niobium are completely explicable.

• Research Organization: Donets State Univ,
• OSTI ID: 6963252
• Journal Information: Inorg. Mater. (Engl. Transl.); (United States), Journal Name: Inorg. Mater. (Engl. Transl.); (United States) Vol. 22:4; ISSN INOMA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
BISMUTH COMPOUNDS
BISMUTH OXIDES
CHALCOGENIDES
CHEMICAL COMPOSITION
COHERENT SCATTERING
CRYSTAL DOPING
CRYSTAL STRUCTURE
DIFFRACTION
ELECTRIC CONDUCTIVITY
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
EQUIPMENT
FILMS
LEAD COMPOUNDS
LEAD OXIDES
METALLURGICAL EFFECTS
NIOBIUM COMPOUNDS
NIOBIUM OXIDES
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
REFRACTORY METAL COMPOUNDS
RESISTORS
RUTHENIUM COMPOUNDS
RUTHENIUM OXIDES
SCATTERING
SEMICONDUCTOR DEVICES
SEMICONDUCTOR RESISTORS
STRUCTURAL CHEMICAL ANALYSIS
TEMPERATURE DEPENDENCE
THERMOELECTRIC PROPERTIES
TRANSITION ELEMENT COMPOUNDS
TUNGSTEN COMPOUNDS
TUNGSTEN OXIDES
X-RAY DIFFRACTION