Transient radiation effects in CCD's

Conference · Tue Nov 30 23:00:00 EST 1976 · IEEE Trans. Nucl. Sci.; (United States)

OSTI ID:7307280

Shedd, W; Buchanan, B

The response of Charge Coupled Device (CCD) linear shift registers to transient ionizing radiation has been evaluated. Dose rates from 6 x 10/sup 4/ to 1 x 10/sup 7/ rads (Si)/sec were used to deliver between .06 and 20 rads per pulse. The measurement techniques used and the response of the CCD register to these exposures is described. The recovery of the CCD to normal operation and the dependence on dose, dose rate and clock frequency is discussed with particular emphasis on the time dependence and mechanism of the device recovery. The practical limitations on CCD applications in an ionizing radiation environment are discussed.

• Research Organization: Rome Air Development Center, Hanscom AFB, MA
• OSTI ID: 7307280
• Journal Information: IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. NS-23:6; ISSN IETNA
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DOSE RATES
ELECTROMAGNETIC RADIATION
GAMMA RADIATION
IONIZING RADIATIONS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATIONS
SEMICONDUCTOR DEVICES
TESTING