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MOCVD deposition of epitaxial LiNbO[sub 3] thin films using the single-source precursor LiNb(OEt)[sub 6]

Journal Article · · Chemistry of Materials; (United States)
DOI:https://doi.org/10.1021/cm00032a002· OSTI ID:7284178
;  [1]
  1. Eastman Kodak Company, Rochester, NY (United States)

In this communication the authors report the fabrication of epitaxial LiNbO[sub 3] thin films of improved crystalline properties and surface morphology using the well-characterized single-source reagent, LiNb(OEt)[sub 6]. The spray MOCVD film fabrication technique used for these depositions is essentially a chemical vapor deposition process in which precursors with relatively low vapor pressure are transported via a mist into a hot-wall reactor where rapid and efficient volatilization occurs. Previous work in this laboratory has demonstrated its utility for the fabrication of high-quality thin films of various semiconductors (i.e., ZnS, GaAs, InSe, and In[sub 2]Se[sub 3][sup 14]) using single-source precursor reagents. A related MOCVD process (supercritical fluid-transport chemical vapor deposition), which can also use precursors of low volatility, has been recently reported.

OSTI ID:
7284178
Journal Information:
Chemistry of Materials; (United States), Journal Name: Chemistry of Materials; (United States) Vol. 5:8; ISSN CMATEX; ISSN 0897-4756
Country of Publication:
United States
Language:
English