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Thin epitaxial silicon for dE/dx detectors

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:7256802
; ; ; ; ;

The techniques for fabricating thin self-supporting epitaxial films for dE/dx detectors have been studied. Detectors having thicknesses between 1 and 4 ..mu..m with areas of 12.5 mm/sup 2/ have been fabricated and tested. The response of the detectors has been studied with alpha particles, oxygen ions, and fission fragments.

Research Organization:
Los Alamos Scientific Lab., NM
OSTI ID:
7256802
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. NS-24:1; ISSN IETNA
Country of Publication:
United States
Language:
English

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Related Subjects

440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGED PARTICLE DETECTION
ELEMENTS
EPITAXY
FABRICATION
FILMS
FISSION FRAGMENT DETECTION
ION DETECTION
MEASURING INSTRUMENTS
RADIATION DETECTION
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SEMIMETALS
SENSITIVITY
SI SEMICONDUCTOR DETECTORS
SILICON
TELESCOPE COUNTERS