Trace element and hydrocarbon analysis of mercuric iodide by ion microprobe and electron induced x-ray fluorescence techniques
Since 1971, research on mercuric iodide (HgI/sub 2/) crystals as nuclear radiation detectors has generated a growing interest in the semiconductor and crystalline properties of this material. An investigation pursued only recently pertains to the trace element and hydrocarbon impurities present in the raw HgI/sub 2/ starting material. While various purifying schemes have been employed, there is only a very limited understanding of their effectiveness. This paper describes studies undertaken with ion microprobe and electron x-ray fluorescence techniques (1) to quantify the trace elements in the residues removed from the starting material as well as in the final single crystals, and (2) to show the influence of impurity removal on nuclear detector performance. Both elemental and hydrocarbon contamination have been identified. The results indicate a preferred method of purification of the HgI/sub 2/ growth material.
- Research Organization:
- EG and G, Inc., Santa Barbara, CA (USA)
- DOE Contract Number:
- EY-76-C-08-1183
- OSTI ID:
- 7254946
- Report Number(s):
- EGG-1183-2355; CONF-770204-2
- Country of Publication:
- United States
- Language:
- English
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Elemental impurity analysis of mercuric iodide by ICP/MS
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Related Subjects
400103* -- Radiometric & Radiochemical Procedures-- (-1987)
400104 -- Spectral Procedures-- (-1987)
440101 -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALKALI METALS
ALKALINE EARTH METALS
ALUMINIUM
CALCIUM
CARBON
CHEMICAL ANALYSIS
CHROMIUM
COPPER
ELEMENTS
HALIDES
HALOGEN COMPOUNDS
HALOGENS
HGI2 SEMICONDUCTOR DETECTORS
IMPURITIES
IODIDES
IODINE
IODINE COMPOUNDS
ION MICROPROBE ANALYSIS
IRON
MEASURING INSTRUMENTS
MERCURY
MERCURY COMPOUNDS
MERCURY HALIDES
MERCURY IODIDES
METALS
NONDESTRUCTIVE ANALYSIS
NONMETALS
POTASSIUM
PURIFICATION
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SEMIMETALS
SILICON
SODIUM
TRACE AMOUNTS
TRANSITION ELEMENTS
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS
ZINC