Elemental impurity analysis of mercuric iodide by ICP/MS

Conference · Tue Jun 01 00:00:00 EDT 1993

OSTI ID:10166760

Cross, E S ^[1]; Mroz, E; Olivares, J A ^[2]

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1. EG and G, Inc., Goleta, CA (United States). Santa Barbara Operations
2. Los Alamos National Lab., NM (United States)

A method has been developed to analyze mercuric iodide (HgI{sub 2}) for elemental contamination using Inductively Coupled Plasma/Mass Spectroscopy (ICP/MS). This paper will discuss the ICP/MS method, the effectiveness of purification schemes for removing impurities from HgI{sub 2}, as well as preliminary correlations between HgI{sub 2} detector performance and elemental contamination levels.

• Research Organization: EG and G, Inc., Goleta, CA (United States). Santa Barbara Operations
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC08-88NV10617
• OSTI ID: 10166760
• Report Number(s): EGG--10617-2197; CONF-9305222--1; ON: DE93015531
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400102
440101
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHEMICAL AND SPECTRAL PROCEDURES
CONTAMINATION
GENERAL DETECTORS OR MONITORS AND RADIOMETRIC INSTRUMENTS
HGI2 SEMICONDUCTOR DETECTORS
IMPURITIES
MASS SPECTROSCOPY
MERCURY IODIDES
PLASMA
QUANTITATIVE CHEMICAL ANALYSIS
TRACE AMOUNTS