Elemental impurity analysis of mercuric iodide by ICP/MS

Conference · Tue Jun 01 00:00:00 EDT 1993

OSTI ID:10166760

Cross, E S ^[1]; Mroz, E; Olivares, J A ^[2]

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1. EG and G, Inc., Goleta, CA (United States). Santa Barbara Operations
2. Los Alamos National Lab., NM (United States)

A method has been developed to analyze mercuric iodide (HgI{sub 2}) for elemental contamination using Inductively Coupled Plasma/Mass Spectroscopy (ICP/MS). This paper will discuss the ICP/MS method, the effectiveness of purification schemes for removing impurities from HgI{sub 2}, as well as preliminary correlations between HgI{sub 2} detector performance and elemental contamination levels.

• Research Organization: EG and G, Inc., Goleta, CA (United States). Santa Barbara Operations
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC08-88NV10617
• OSTI ID: 10166760
• Report Number(s): EGG-10617-2197; CONF-9305222-1; ON: DE93015531; TRN: 93:016259
• Resource Relation: Conference: 41. American Society of Mass Spectrometry conference on mass spectrometry and allied topics,San Francisco, CA (United States),30 May - 4 Jun 1993; Other Information: PBD: [1993]
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MERCURY IODIDES
QUANTITATIVE CHEMICAL ANALYSIS
HGI2 SEMICONDUCTOR DETECTORS
CONTAMINATION
IMPURITIES
PLASMA
MASS SPECTROSCOPY
TRACE AMOUNTS
400102
440101
CHEMICAL AND SPECTRAL PROCEDURES
GENERAL DETECTORS OR MONITORS AND RADIOMETRIC INSTRUMENTS