Elemental impurity analysis of mercuric iodide by ICP/MS

Conference · Thu Dec 31 23:00:00 EST 1992

OSTI ID:6202423

Cross, E S ^[1]; Mroz, E; Olivares, J A ^[2]

---

1. EG and G, Inc., Goleta, CA (United States). Santa Barbara Operations
2. Los Alamos National Lab., NM (United States)

A method has been developed to analyze mercuric iodide (HgI[sub 2]) for elemental contamination using Inductively Coupled Plasma/Mass Spectroscopy (ICP/MS). This paper will discuss the ICP/MS method, the effectiveness of purification schemes for removing impurities from HgI[sub 2], as well as preliminary correlations between HgI[sub 2] detector performance and elemental contamination levels.

• Research Organization: EG and G, Inc., Goleta, CA (United States). Santa Barbara Operations
• Sponsoring Organization: DOE; USDOE, Washington, DC (United States)
• DOE Contract Number: AC08-88NV10617
• OSTI ID: 6202423
• Report Number(s): EGG-10617-2197; CONF-9305222--1; ON: DE93015531
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400102* -- Chemical & Spectral Procedures
440101 -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHEMICAL ANALYSIS
CONTAMINATION
HALIDES
HALOGEN COMPOUNDS
HGI2 SEMICONDUCTOR DETECTORS
IMPURITIES
IODIDES
IODINE COMPOUNDS
MASS SPECTROSCOPY
MEASURING INSTRUMENTS
MERCURY COMPOUNDS
MERCURY HALIDES
MERCURY IODIDES
PLASMA
QUANTITATIVE CHEMICAL ANALYSIS
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SPECTROSCOPY
TRACE AMOUNTS