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Characterization of nitride coatings by Auger electron spectroscopy and x-ray photoelectron spectroscopy

Journal Article · · J. Vac. Sci. Technol., A; (United States)
DOI:https://doi.org/10.1116/1.573680· OSTI ID:7241037
The dependence of technically important properties of wear resistant nitride coatings on chemical composition requires advanced methods of compositional analysis to establish optimized fabrication processes. High spatial resolution and chemical bonding specificity are provided by such techniques as Auger electron spectroscopy (AES) in the form of scanning Auger microscopy (SAM) and x-ray photoelectron spectroscopy (XPS). A survey is given for the study of reactively sputter deposited Ti--N, Hf--N, and Ti--Al--N coatings on high-speed steel substrates using point, line, and in-depth distribution analysis by SAM in conjunction with sputter profiling. Capabilities and limitations of quantitative AES to determine the influence of processing parameters on coating composition are presented. XPS gives additional information on chemical bonding and on quantification. This is particularly important in cases of peak overlapping in Auger spectra (e.g., TiN).
Research Organization:
Max-Planck-Institut fuer Metallforschung, Institut fuer Werkstoffwissenschaften, Seestrasse, D-7000 Stuttgart 1, Federal Republic of Germany
OSTI ID:
7241037
Journal Information:
J. Vac. Sci. Technol., A; (United States), Journal Name: J. Vac. Sci. Technol., A; (United States) Vol. 4:6; ISSN JVTAD
Country of Publication:
United States
Language:
English