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Influence of /sup 16/O, /sup 12/C, /sup 14/N, and noble gases on the crystallization of amorphous Si layers

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.323409· OSTI ID:7214998
Channeling effect measurements have been used to study the effect of impurities on the epitaxial regrowth of amorphous silicon layers on single-crystal silicon. Implantation was used to form the amorphous layers and also to introduce the impurities /sup 12/C, /sup 14/N, /sup 16/O, /sup 20/Ne, /sup 40/A, and /sup 84/Kr. For /sup 16/O implants, the growth rate at 550 /sup 0/C depended on the /sup 16/O concentration and at the level of 0.5 at.% the rate was reduced from about 90 to about 10 A/min. For similar atomic concentrations of /sup 14/N, the rate was comparable to the /sup 16/O case. For comparable concentrations of /sup 12/C, the regrowth rate was found to be three times higher than for that of the /sup 16/O case. Noble gas ions are also found to retard the growth rate of the amorphous layers. For /sup 40/Ar at about the 0.5-at.% level, the regrowth rate is appreciably slower than even that for the /sup 16/O case.
Research Organization:
California Institute of Technology, Pasadena, California 91125
OSTI ID:
7214998
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 48:10; ISSN JAPIA
Country of Publication:
United States
Language:
English