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Growth and properties of a multilayer system based on Y sub 1 Ba sub 2 Cu sub 3 O sub x and amorphous Y-ZrO sub 2

Journal Article · · Journal of Applied Physics; (United States)
DOI:https://doi.org/10.1063/1.352157· OSTI ID:7202050
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  1. Department of Physics, Chalmers University of Technology, S-412 96 Gothenburg (Sweden)

The growth of {ital c}-axis oriented Y{sub 1}Ba{sub 2}Cu{sub 3}O{sub {ital x}} thin films on an amorphous buffer layer of Y-ZrO{sub 2}, deposited on sapphire substrates, was investigated. Both films were grown by a pulsed laser deposition technique. A strong correlation was observed between the properties of Y{sub 1}Ba{sub 2}Cu{sub 3}O{sub {ital x}} and the thickness of the buffer layer. A {ital T}{sub {ital c}} of 89 K was obtained for an optimal buffer layer thickness of 9 nm. A model that adequately describes the film growth process was developed. A multilayer system of Y{sub 1}Ba{sub 2}Cu{sub 3}O{sub {ital x}} and amorphous Y-ZrO{sub 2} was grown and a {ital T}{sub {ital c}} of 87 K for the upper {ital c}-axis oriented layer was measured.

OSTI ID:
7202050
Journal Information:
Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 72:1; ISSN 0021-8979; ISSN JAPIA
Country of Publication:
United States
Language:
English