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Title: Raman scattering near the ( E sub 0 +. Delta. sub 0 ) resonance from (211)-oriented Ga sub 1 minus x In sub x As/GaAs multiple quantum wells

Journal Article · · Physical Review, B: Condensed Matter; (United States)
;  [1]; ;  [2]
  1. Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
  2. Department of Electrical and Computer Engineering, University of California at Santa Barbara, Santa Barbara, California 93106 (United States)

We present a Raman-scattering study of (211)-oriented Ga{sub 1{minus}{ital x}}In{sub {ital x}}As/GaAs multiple quantum wells grown by use of molecular-beam epitaxy. Off resonance, the Raman scattering satisfied bulk zinc-blende-structure selection rules. Near the ({ital E}{sub 0}+{Delta}{sub 0}) resonance, there is strong LO-phonon Raman scattering in the {ital Z}{prime}({ital X}{prime},{ital X}{prime}){ital {bar Z}} {prime} configuration, where {ital Z}{prime} refers to the growth axis and {ital X}{prime} is in a ({bar 1}11) direction. LO-phonon Raman scattering is forbidden in this configuration by bulk zinc-blende-structure selection rules and does not occur (or at least is much weaker) in (211)-oriented GaAs substrates near this resonance. This Raman process is due to Froehlich-interaction electron-phonon scattering activated by the strain-generated electric fields that occur in the multiple-quantum-well structure. We measure the resonance profile of this Raman process. The scattering efficiency is found to decrease with increasing laser intensity, because of a screening of the strain-generated fields by photoexcited free carriers. We present an electronic-structure calculation that accounts for the energy position of the resonance profile. Based on the electronic-structure results, we discuss simple models for the shape of the resonance profile. A free-carrier screening calculation accurately describes the observed laser-intensity dependence of the efficiency of this Raman process.

OSTI ID:
7201384
Journal Information:
Physical Review, B: Condensed Matter; (United States), Vol. 46:3; ISSN 0163-1829
Country of Publication:
United States
Language:
English