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Si deposition from chlorosilanes; 1: Deposition modeling

Journal Article · · Journal of the Electrochemical Society; (United States)
DOI:https://doi.org/10.1149/1.2055063· OSTI ID:7181499
 [1]
  1. Northeastern Univ., Boston, MA (United States). Dept. of Mechanical Engineering

Deposition of silicon from chlorosilanes is studied. Based on a model for gas-phase reactions involving SiCl[sub 4], SiHCl[sub 3], SiCl[sub 2], and HCl, the reaction constants for relevant gas-phase reactions are determined. Deposition is analyzed in two ways: one (effusive flux model) using the surface reaction probabilities of surface reactions, and the other (surface reaction model) derived previously by Korea in terms of surface reactions of SiCl[sub 2]. Advantages as well as disadvantages of the two models are discussed by comparing fully numerical results with the experimental results available.

OSTI ID:
7181499
Journal Information:
Journal of the Electrochemical Society; (United States), Journal Name: Journal of the Electrochemical Society; (United States) Vol. 141:8; ISSN JESOAN; ISSN 0013-4651
Country of Publication:
United States
Language:
English