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Si deposition from chlorosilanes; 2: Numerical analysis of thermofluid effects on deposition

Journal Article · · Journal of the Electrochemical Society; (United States)
DOI:https://doi.org/10.1149/1.2055064· OSTI ID:7181542
 [1]
  1. Northeastern Univ., Boston, MA (United States). Dept. of Mechanical Engineering
Based on the effusive flux model developed in Part 1 (the preceding article), various effects of flow and thermal fields are investigated numerically for deposition from SiCl[sub 4] dilutely mixed in hydrogen passing through a rectangular reactor. Generation and transport of HCl and SiCl[sub 2] near the deposition surface is examined in detail. Thermofluid effects on deposition are presented in terms of such nondimensional parameters as the inverse Graetz number and the Rayleigh number.
OSTI ID:
7181542
Journal Information:
Journal of the Electrochemical Society; (United States), Journal Name: Journal of the Electrochemical Society; (United States) Vol. 141:8; ISSN JESOAN; ISSN 0013-4651
Country of Publication:
United States
Language:
English