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In situ x-ray diffraction studies of YBa sub 2 Cu sub 3 O sub x

Journal Article · · Journal of Applied Physics; (United States)
DOI:https://doi.org/10.1063/1.352093· OSTI ID:7163264
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  1. NSF Science and Technology Center for Superconductivity and Materials Research Center, Northwestern University, Evanston, Illinois 60208 (United States)
  2. Material Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Using a specially designed off-axis faced magnetron sputtering chamber we have performed {ital in} {ital situ} x-ray diffraction studies of the growth of YBa{sub 2}Cu{sub 3}O{sub {ital x}} films using a synchrotron light source. The orientation and rocking curve width were studied as a function of substrate temperature, O{sub 2}/Ar partial pressures, and deposition rate. Growth rate was studied on SrTiO{sub 3}, LaAlO{sub 3}, and MgO.
OSTI ID:
7163264
Journal Information:
Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 72:10; ISSN 0021-8979; ISSN JAPIA
Country of Publication:
United States
Language:
English