Terracing in strained-layer superlattices

Journal Article · Thu Sep 15 04:00:00 EDT 1988 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.342494· OSTI ID:7144962

Neumann, D A; Zabel, H; Morkoc, H

We report on an x-ray diffraction study of GaAs/GaAs/sub 1-//sub x/Sb/sub x/ superlattices grown by molecular-beam epitaxy on miscut GaAs (100) substrates. The fundamental reflections of the superlattice lie on a reciprocal lattice rod which is tilted with respect to the reciprocal lattice rod of the substrate. The satellite reflection, in turn, lies on lines making a constant angle with the reciprocal lattice rod containing the fundamental reflections. This result is attributed to a terraced superlattice which, in addition, is tilted with respect to the substrate. We describe a model which approximates the misfit strain imposed on the superlattice at the interfacial step, and which is capable of relating the average tilt angle to the misfit strain. The same model can also explain the transverse broadenings observed for the superlattice peaks.

• Research Organization: Department of Physics and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
• OSTI ID: 7144962
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 64:6; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
ANTIMONY COMPOUNDS
ARSENIC COMPOUNDS
ARSENIDES
COHERENT SCATTERING
CRYSTAL STRUCTURE
DIFFRACTION
GALLIUM ANTIMONIDES
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
INTERFACES
PNICTIDES
SCATTERING
SUPERLATTICES
SURFACES
X-RAY DIFFRACTION