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X-ray evidence for a terraced GaAs/AlAs superlattice

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.94120· OSTI ID:5784974
We report an x-ray diffraction study of a GaAs/AlAs superlattice, showing satellite reflections which lie on a line making a constant, nonzero angle with the (00L) reciprocal lattice rod containing the fundamental reflections. The results indicate a terraced superlattice structure in which the chemical modulation of the GaAs/AlAs layers is tilted with respect to the (001) lattice planes. This tilt imposes a reduced lateral domain size on the superlattice, which can be deduced from the angular widths of the satellite reflections.
Research Organization:
Department of Physics and Materials Research Laboratory, University of Illinois at Urbana--Champaign, Urbana, Illinois 61801
DOE Contract Number:
AC02-76ER01198
OSTI ID:
5784974
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 43:1; ISSN APPLA
Country of Publication:
United States
Language:
English