X-ray evidence for a terraced GaAs/AlAs superlattice
Journal Article
·
· Appl. Phys. Lett.; (United States)
We report an x-ray diffraction study of a GaAs/AlAs superlattice, showing satellite reflections which lie on a line making a constant, nonzero angle with the (00L) reciprocal lattice rod containing the fundamental reflections. The results indicate a terraced superlattice structure in which the chemical modulation of the GaAs/AlAs layers is tilted with respect to the (001) lattice planes. This tilt imposes a reduced lateral domain size on the superlattice, which can be deduced from the angular widths of the satellite reflections.
- Research Organization:
- Department of Physics and Materials Research Laboratory, University of Illinois at Urbana--Champaign, Urbana, Illinois 61801
- DOE Contract Number:
- AC02-76ER01198
- OSTI ID:
- 5784974
- Journal Information:
- Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 43:1; ISSN APPLA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
ALUMINIUM ARSENIDES
ALUMINIUM COMPOUNDS
ARSENIC COMPOUNDS
ARSENIDES
COHERENT SCATTERING
CRYSTAL LATTICES
CRYSTAL STRUCTURE
DIFFRACTION
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
LAYERS
PNICTIDES
REFLECTION
SCATTERING
SUPERLATTICES
VARIATIONS
X-RAY DIFFRACTION
360602* -- Other Materials-- Structure & Phase Studies
ALUMINIUM ARSENIDES
ALUMINIUM COMPOUNDS
ARSENIC COMPOUNDS
ARSENIDES
COHERENT SCATTERING
CRYSTAL LATTICES
CRYSTAL STRUCTURE
DIFFRACTION
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
LAYERS
PNICTIDES
REFLECTION
SCATTERING
SUPERLATTICES
VARIATIONS
X-RAY DIFFRACTION