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Spatial profiling of ion and neutral excitation in noble gas electron cyclotron resonance plasmas

Journal Article · · Applied Physics Letters; (United States)
DOI:https://doi.org/10.1063/1.112844· OSTI ID:7138374
;  [1]
  1. Oak Ridge National Laboratory, Solid State Division, P. O. Box 2008, MS 6057, Oak Ridge, Tennessee 37831-6057 (United States)
Optical emission from neutrals and ions of several noble gases has been profiled in an electron cyclotron resonance plasma system. In argon plasmas with a net microwave power of 750 W, the neutral (696.5-nm) and ion (488-nm) emission profiles are slightly center peaked at 0.32 mTorr and gradually shift to a hollow appearance at 2.5 mTorr. Neon profiles show a similar trend from 2.5 to 10.0 mTorr. For the noble gases, transition pressure scales with the ionization potential of the gas, which is consistent with neutral depletion. Studies of noble gas mixtures, however, indicate that neutral depletion is not always dominant in the formation of hollow profiles. For Kr/Ar, Ar/Ne, and Ne/He plasmas, the majority gas tends to set the overall shape of the profile at any given pressure. For the conditions of the current system, plasma density appears to be more dominant than electron temperature in the formation of hollow profiles. The general method described is also a straightforward, inexpensive technique for measuring the spatial distribution of power deposited in plasmas, particularly where absolute scale can be calibrated by some other means.
DOE Contract Number:
AC05-84OR21400
OSTI ID:
7138374
Journal Information:
Applied Physics Letters; (United States), Journal Name: Applied Physics Letters; (United States) Vol. 65:16; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English