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U.S. Department of Energy
Office of Scientific and Technical Information

Investigation of the MBE growth and properties of Al/sub y/Ga/sub y/In/sub 1-x-y/As/InP and InGaAs-InAlAs superlattices: Progress report for May 15, 1986--August 1, 1988

Technical Report ·
OSTI ID:7127473
The focus of the work has been to grow wide-bandgap ternary and quaternary semiconductors InAlAs and InGaAlAs by molecular beam epitaxy and to investigate their electronic, optical and structural characteristics. The techniques being used are x-ray, TEM, photoluminescence and absorption, DLTS, Hall transport, and Raman Spectroscopy. The experiments have included both lattice matched and strained layers. Several new results have been obtained. 16 refs. 4 figs.
Research Organization:
Michigan Univ., Ann Arbor (USA). Dept. of Electrical Engineering and Computer Science
DOE Contract Number:
FG02-86ER45250
OSTI ID:
7127473
Report Number(s):
DOE/ER/45250-2; ON: DE88015477
Country of Publication:
United States
Language:
English