Soft-x-ray emission insulators: Spectator versus normal emission

Journal Article · Mon Jan 11 04:00:00 EST 1993 · Physical Review Letters; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.70.238· OSTI ID:7118839

O'Brien, W L; Jia, J; Dong, Q; Callcott, T A ^[1]; Miyano, K E; Ederer, D L ^[2]; Mueller, D R ^[3]; Kao, C ^[4]

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1. University of Tennessee, Knoxville, Tennessee 37996 (United States)
2. Tulane University, New Orleans, Louisiana 70118 (United States)
3. National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
4. Brookhaven National Laboratory, Upton, New York 11973 (United States)

We investigate the excitation energy dependence of the boron [ital K] soft-x-ray emission of B[sub 2]O[sub 3] and hexagonal-BN using synchrotron radiation. When exciting into the core exciton state the spectra are shifted to lower energy by 1.5 and 1.8 eV, respectively. This shift is found to be a result of phonon relaxation and differences in initial-and final-state electronic screening.

• OSTI ID: 7118839
• Journal Information: Physical Review Letters; (United States), Journal Name: Physical Review Letters; (United States) Vol. 70:2; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360204 -- Ceramics
Cermets
& Refractories-- Physical Properties
665100* -- Nuclear Techniques in Condensed Matter Physics -- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
AUGER EFFECT
BORON COMPOUNDS
BORON NITRIDES
BORON OXIDES
BRANCHING RATIO
CHALCOGENIDES
CHEMICAL ANALYSIS
DATA ANALYSIS
ELECTRONIC STRUCTURE
EXCITONS
K SHELL
NITRIDES
NITROGEN COMPOUNDS
NONDESTRUCTIVE ANALYSIS
OXIDES
OXYGEN COMPOUNDS
PHONONS
PNICTIDES
QUASI PARTICLES
SCREENING
SPECTRAL SHIFT
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS