Resonant inelastic x-ray scattering in hexagonal boron nitride observed by soft-x-ray fluorescence spectroscopy
- University of Tennessee, Knoxville, Tennessee 37996 (United States)
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
- Lawrence Livermore National Laboratory, Livermore, California 94551 (United States)
- Tulane University, New Orleans, Louisiana 70118 (United States)
- University of Wisconsin-Madison, Madison, Wisconsin 53706 (United States)
- Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)
Photon-excited B {ital K} fluorescence spectra were measured for hexagonal boron nitride using tunable synchrotron radiation below and above the B {ital K} edge. We report Raman-like resonant inelastic scattering of soft x rays involving excitation of delocalized valence-band electrons. The inelastic scattering features track with the excitation energy below threshold, go through a resonance as the excitation is tuned to the B(1{ital s}) core-exciton energy, and evolve into incoherent fluorescence as the excitation is raised further. The energy loss is identified as equivalent to an electronic transition of valence {sigma} electrons to {pi}{sup *} conduction-band states. {copyright} {ital 1996 The American Physical Society.}
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- DOE Contract Number:
- AC03-76SF00098; W-7405-ENG-48
- OSTI ID:
- 285726
- Journal Information:
- Physical Review Letters, Vol. 76, Issue 21; Other Information: PBD: May 1996
- Country of Publication:
- United States
- Language:
- English
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