X-ray Raman scattering in H-BN observed by soft x-ray fluorescence spectroscopy
- Tennessee Univ., Knoxville, TN (United States)
- Lawrence Livermore National Lab., CA (United States)
- Tulane Univ., New Orleans, LA (United States)
- International Business Machines Corp., Yorktown Heights, NY (United States). Thomas J. Watson Research Center
- Lawrence Berkeley Lab., CA (United States)
Raman scattering of soft x-rays is observed in h-BN using monochromatic soft x-rays just below the B K absorption edge. The inelastic features are visible below threshold, track with the excitation energy, go through a resonance as the excitation is tuned to the B ls core exciton energy, and finally evolve into normal fluorescence as the excitation is raised above the energy needed to excite the B ls electron into the conduction band. The inelastic energy loss is identified as an excitation of valence {sigma} electrons into the {pi}* valence exciton state; at resonance and above, {pi} {minus} {pi}* transitions are also observed. At resonance, a sideband on the elastic peak Ls observed, which gives evidence of additional electronic and phonon loss processes. Very similar results have also been observed for B{sub 2}O{sub 3}.
- Research Organization:
- Lawrence Berkeley Lab., CA (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States); National Science Foundation, Washington, DC (United States)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 70794
- Report Number(s):
- LBL--36923; ON: DE95012360; IN: LSBL-249; CNN: Grants DMR-9017996, DMR-9017997
- Country of Publication:
- United States
- Language:
- English
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