An electron beam ion source for laboratory experiments

Journal Article · Mon Jun 01 04:00:00 EDT 1992 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1143743· OSTI ID:7114284

Beebe, E N; Kostroun, V O ^[1]

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1. Nuclear Science and Engineering Program, Ward Laboratory, Cornell University, Ithaca, New York 14853 (United States)

The design and properties of an electron beam ion source (EBIS) capable of producing low-energy, highly charged ions such as Ar{sup 16+} and Xe{sup 30+} are described. The source, to be used in laboratory experiments in atomic and surface physics, utilizes a conventional, 0.42-T solenoid and an externally launched electron beam. Ultrahigh vacuum in the ionization region is created by a distributed sputter-ion pump. The source design is relatively simple, and the source is small and easy to operate. The concept of a saturated electron beam is introduced in order to explain the observed argon and xenon ion charge state evolution. Very high ion charge states can be produced by confining ions for times up to 1 s in an electron beam in which the degree of space-charge neutralization by ions is determined by potentials applied to the drift tubes.

• DOE Contract Number: FG02-86ER13519
• OSTI ID: 7114284
• Journal Information: Review of Scientific Instruments; (United States), Journal Name: Review of Scientific Instruments; (United States) Vol. 63:6; ISSN RSINA; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

661220* -- Particle Beam Production & Handling
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ARGON IONS
BEAM NEUTRALIZATION
BEAMS
CHARGED PARTICLES
DESIGN
DRIFT TUBES
ELECTRON BEAMS
ION SOURCES
IONS
LEPTON BEAMS
PARTICLE BEAMS
SPUTTERING
Ta
Targets-- (1992-)
XENON IONS