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Cornell electron beam ion source

Journal Article · · IEEE Trans. Nucl. Sci.; (United States)

An electron beam ion source (EBIS) for the production of low energy, multiply charged ion beams to be used in atomic physics experiments has been designed and constructed. An external high perveance electron gun is used to launch the electron beam into a conventional solenoid. Novel features of the design include a distributed sputter ion pump to create the ultrahigh vacuum environment in the ionization region of the source and microprocessor control of the axial trap voltage supplies.

Research Organization:
Cornell Univ., Ithaca, NY
OSTI ID:
6322187
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. NS-28:3; ISSN IETNA
Country of Publication:
United States
Language:
English