First stage in the development of a soft-x-ray reflection imaging microscope in the Schwarzschild configuration using a soft-x-ray laser at 18. 2 nm

Journal Article · Tue Jan 14 23:00:00 EST 1992 · Optics Letters; (United States)

DOI:https://doi.org/10.1364/OL.17.000157· OSTI ID:7114283

DiCicco, D S; Kim, D; Rosser, R; Suckewer, S ^[1]

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1. Princeton Plasma Physics Laboratory and Department of Mechanical and Aerospace Engineering, Princeton University, Princeton, New Jersey 08543 (United States)

We present results that demonstrate the proof of principle of a soft-x-ray reflection imaging microscope in the Schwarzschild configuration. A soft-x-ray laser operating at 18.2 nm was used as the x-ray source. Mo/Si multilayer mirrors with a normal-incidence reflectivity of {similar to}20% per surface at 18.2-nm wavelength were used in the Schwarzschild objective.

• OSTI ID: 7114283
• Journal Information: Optics Letters; (United States), Journal Name: Optics Letters; (United States) Vol. 17:2; ISSN 0146-9592; ISSN OPLED
• Country of Publication: United States
• Language: English

Related Subjects

661300* -- Other Aspects of Physical Science-- (1992-)
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
COATINGS
COPPER
DENSITOMETERS
ELECTROMAGNETIC RADIATION
ELEMENTS
EQUIPMENT
GLASS
GOLD
IMAGES
IONIZING RADIATIONS
LASERS
MEASURING INSTRUMENTS
METALS
MICROSCOPY
MIRRORS
OPTICAL EQUIPMENT
OPTICAL REFLECTION
OPTICAL SYSTEMS
PHOTOMETERS
RADIATIONS
REFLECTION
SOFT X RADIATION
TRANSITION ELEMENTS
USES
X RADIATION
X-RAY LASERS