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Layer-by-layer deposition of La sub 1. 85 Sr sub 0. 15 CuO sub x films by pulsed laser ablation

Journal Article · · Applied Physics Letters; (United States)
DOI:https://doi.org/10.1063/1.106778· OSTI ID:7111262
; ;  [1]
  1. IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598 (United States)
Reflection high-energy electron diffraction (RHEED) has been used to monitor the growth of La{sub 1.85}Sr{sub 0.15}CuO{sub {ital x}} (LSCO) thin films on (100) SrTiO{sub 3} substrates by pulsed laser deposition. The films are grown using a combination of pulsed molecular oxygen and a continuous source of atomic oxygen, with the average background pressure maintained as low as 1 mTorr. The RHEED pattern is sharp and streaky, and the intensity of the specular beam oscillates during the deposition, indicating a two-dimensional layer-by-layer epitaxial growth. The film thickness measured by x-ray small-angle interference is consistent with the thickness determined by the RHEED oscillation period with a growth unit of half a unit cell. Thin films of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) with good RHEED oscillations have also been grown under similar oxygenation conditions. The low-pressure-grown LSCO and YBCO films are superconducting, with zero-resistance temperatures of 15 and 80 K, respectively.
OSTI ID:
7111262
Journal Information:
Applied Physics Letters; (United States), Journal Name: Applied Physics Letters; (United States) Vol. 60:24; ISSN APPLA; ISSN 0003-6951
Country of Publication:
United States
Language:
English